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3pF, 4kV, SCR & Diode Rail Clamp Array
StandoffVoltage(V): 30
ILeak(μA): 0.02
ESD Contact(kV): 4
3pF, 8kV, SCR & Diode Rail Clamp Array
StandoffVoltage(V): 20
ILeak(μA): 0.01
ESD Contact(kV): 8
5pF, 8kV, SCR & Diode Rail Clamp Array
ILeak(μA): 0.005, 0.02
Designers of today’s electronic devices have demanded more functionality with greater flexibility and higher levels of user interaction...
Electronics Circuit Protection Product Selection Guide - A guide to selecting Littelfuse circuit protection components for electronic applications...
Littelfuse is the world leader in the design and manufacturing of fuses for the automotive, industrial, handheld, computer and telecom markets...
This application note covers IEC 61000-4-2 ESD immunity and transient current capability for the SP72X Series protection arrays. The SP720, SP721, SP723, and SP724 are protection ICs with an array of SCR/Diode bipolar structures for ESD and over-voltage protection of sensitive input circuits. They have 2 protection SCR/Diode device structures per input.
This application note discusses ESD and transient protection using the SP720. For a given level of voltage or power, there is a defined degree of protection compatible to that need. For the SP720, the protection circuits are designed to clamp over-voltage within a range of peak current that will substantially improve the survival input expectancy of average monolithic silicon circuits used for small signal and digital processing applications.
The purpose of this application note is to focus on customer concerns related to the fast switching characteristics of the SP720, SP721 and SP723 family of protection ICs during an ESD discharge. The SCR cell structures of this family were first introduced for ESD protection of sensitive ICs that were subject to substantially more severe conditions than normal Human Body Model stress.
This application note discusses the purpose of the International Electrotechnical Commission lEC 61000-4 (previously known as lEC-801) standard which established a common reference for evaluating the performance of industrial-process measurement and control instrumentation when exposed to electric or electromagnetic interference.
This application brief demonstrates how to ensure reliable and safe circuit operation of USB products, protection against voltage and current transients must be carefully considered. Due to the higher data rates of USB 2.0, attention to the electrical characteristics of protection solutions is required.
Littelfuse Silicon Protection Array family of TVS Diode Arrays (SPA® Diodes) are designed to protect analog and digital signal lines...
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