Semiconductor Analytical Services

We offer expedited turn-key analytical services for evaluation of semiconductor components and packaging.

Services include:

  • Scanning electron microscopy
  • Qualitative X-ray microanalysis
  • Real-time X-ray
  • Packaging and die level cross-sectioning
  • Chemical decapsulation
  • Wet and dry chemical vertical de-layering
  • Liquid crystal hotspot detection

To provide these services, we use state-of-the-art equipment from established companies such as JEOL, Nicolet Imaging Systems, IMI Integrated, B&G, and Royce Instruments.

For more information about how our semiconductor analytical services can help you, please complete this form: